为了研究外加电场对脉冲激光沉积纳米Si晶粒的影响,采用XeCl准分子激光器,烧蚀高阻抗单晶Si靶,在10 Pa氩气环境下,调整外加电压的强度,沉积制备了一系列Si薄膜.X线衍射(XRD)谱仪、拉曼(Raman)谱、扫描电子显微镜(SEM)图像均显示纳米Si晶粒已经形成,随着靶衬间距的增加,所形成的纳米Si晶粒的平均尺寸和面密度分布均呈现先增大后减小的变化趋势,并且二者都在1.3 cm处达到最大值;同时随着外加电压的增大,衬底上纳米Si晶粒消失的位置离靶距离变短.从传榆动力学角度,对实验结果进行了定性分析.
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