Journal of Hebei University(Natural Science Edition) >

2010 , Vol. 30 >Issue 5: 609 - 612

DOI: https://doi.org/10.3969/j.issn.1000-1565.2010.05.036

Research on Technique of Performance Test to ESD Protection Device

  • ZHANG Xi-jun ,
  • FAN Li-si ,
  • WANG Zhen-xing ,
  • WANG Shu-ping
Expand

Online published: 2010-09-25

Fold

Cite this article

ZHANG Xi-jun , FAN Li-si , WANG Zhen-xing , WANG Shu-ping . Research on Technique of Performance Test to ESD Protection Device[J]. Journal of Hebei University(Natural Science Edition), 2010 , 30(5) : 609 -612 . DOI: 10.3969/j.issn.1000-1565.2010.05.036

References

[1] Honda M.. A new threat-EMI effect by indirect ESD on electronic equipment [J]. IEEE Transactions on Industry Applications 1989, 5(5).
[2] HOPEWELL N J. Bell labs engineers detect Invisible microcircuit killers [M]. New Jersey:Lucent Technologies, Press Releases 1998.
[3] 刘尚合, 魏光辉, 刘直承. 静电理论与保护 [M]. 北京:兵器工业出版社 1999.
[4] 刘尚合, 武占成, 朱长清. 静电放电与危害防护 [M]. 北京:北京邮电大学出版社 2004.
[5] IEC 61340-3-1, 2006.Methods for simulation of electrostatic effects-human body model[HBM] electrostatic discharge test waveforms [S].
Options
Outlines

/

〈 〉