The metal insulator semicsnductor light emitting diod(MIS-LED)with the erbium-doped silicom-rich silicom oxide was fabricated by radio frequency co-sputtering combined with post-annealing technique.The luminescence and electrical properties of the device were characterized by electroluminescence(EL)spectra and current-voltage measurement.Carrier transport and charge trapping mechanisms of the LEDs with different excess silicon content were investigated.Excitation and quenching mechanisms of the electroluminescence from erbium ions in the device were also studied and explained.The results indicated that, with the excess silicon in the MIS-LEDs, the conduction of carriers transform from Fowler-Nordheim tunneling to hopping conduction and the quenching of the EL can be attributed to the energy reduction of the injected electrons and the lowered excitation efficiency of the erbium ions.In addition, the Auger effect induced by charge trapping would also account for the nonradiative recombination processes.
ZHANG Huiyu
,
ZHAO Jing
,
GUO Qiang
,
LIU Haixu
,
DING Wenge
. Decay mechanism of the erbium-doped silicon-rich silicon oxide electroluminescence device[J]. Journal of Hebei University(Natural Science Edition), 2017
, 37(4)
: 360
-363
.
DOI: 10.3969/j.issn.1000-1565.2017.04.005掺铒富硅氧化硅发光器件电致发光衰减机制
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