河北大学学报(自然科学版) ›› 2025, Vol. 45 ›› Issue (2): 148-156.DOI: 10.3969/j.issn.1000-1565.2025.02.005

• • 上一篇    

用于LED照明产品寿命预测的结温测试

武德起1,2,于宾2,赵南南2,李卫庭2,楚晓杏2   

  • 收稿日期:2023-11-15 发布日期:2025-03-26
  • 作者简介:武德起(1969—),男,中国科学院副研究员,主要从事光学探测、传感器技术及物联网应用等方向的研究工作.
    E-mail:deqi2000@126.com;wudeqi@ime.ac.cn
  • 基金资助:
    河南省科技攻关项目(232102210157;252102310005)

Junction-temperature measurement for life expecpancy of LED lighting products

WU Deqi1,2, YU Bin2, ZHAO Nannan2, LI Weiting2, CHU Xiaoxing2   

  1. 1. Institute of Microelectrics, Chinese Academy of Science(CAS), Beijing 100029, China; 2. Industrial Technology Research Institute, Henan Mechanical and Electrical Vocational College, Zhengzhou 451191, China
  • Received:2023-11-15 Published:2025-03-26

摘要: LED照明产品的使用寿命已经达到数万小时,如何加速测试LED照明产品的预测寿命成为当下的研究热点.温度应力法预测LED照明产品的寿命预期接受度高,有望成为理想的加速寿命测试方法,然而,在该方法中与样品预测寿命密切相关的结温测试一直以来没有很好的解决办法.介绍了一种结电压变化法间接测量结温的方法,并对测试误差可能造成的预测寿命影响作了详尽的推算分析.

关键词: 结温, 结电压, 温度应力, 加速寿命测试, 温度系数

Abstract: The life expectancy of LED lighting products has reached tens of thousands of hours. How to forecast LED’s life expectancy by accelerated life testing method has become a hot topic. Thermal stress method has been widely accepted and could be an ideal method for accelerating life measurement. However, how to measure the junction-temperature, which is closely related to the lifetime prediction, hasn’t been solved properly.A junction-temperature indirect test method by testing the change in junction voltage was introduced in this paper, and the possible influence on lifetime prediction caused by junction-temperature test error was analyzed in detail.

Key words: junction-temperature, junction voltage, thermal stress, accelerated life testing, temperature coefficient

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