河北大学学报(自然科学版) ›› 2010, Vol. 30 ›› Issue (1): 19-22.DOI: 10.3969/j.issn.1000-1565.2010.01.005

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Ni-Al底电极对偏氟乙烯-三氟乙烯共聚物铁电薄膜性能的影响

张旭,赵庆勋,李晓红,刘保亭   

  1. 河北大学,物理科学与技术学院,河北,保定,071002
  • 出版日期:2010-01-25 发布日期:2010-01-25
  • 基金资助:
    河北省自然科学基金

Effect of Ni-Al Bottom Electrode on Ferroelectric Properties of Poly Vinylidene Fluoride with Trifluoroethylene Copolymer Films

ZHANG Xu,ZHAO Qing-xun,LI Xiao-hong,LIU Bao-ting   

  • Online:2010-01-25 Published:2010-01-25

摘要: 利用磁控溅射法,在Si(100)衬底上制备了不同厚度的非晶导电薄膜Ni-Al底电极,并采用直滴法、退火工艺和掩膜技术,首先制备了偏氟乙烯-三氟乙烯P(VDF-TrFE)共聚物铁电薄膜,并构架了Al/ P(VDF-TrFE)/Ni-Al/Si铁电电容器异质结.采用X线衍射仪(XRD)、铁电测试仪(Precision LC unit)等测试手段对薄膜的性能进行了表征.结果表明:Ni-Al薄膜厚度对偏氟乙烯-三氟乙烯共聚物薄膜的漏电流产生较大影响,当厚度为36 nm时,其漏电流密度达到2.09×10~(-5) A/cm~2;所构架的Al/ P(VDF-TrFE) /Ni-Al /Si电容器呈现2种漏电机理,在较低的电场范围内,电容器的导电机理为欧姆导电机理,在高电场下为界面肖特基导电机理.

关键词: 偏氟乙烯-三氟乙烯, 漏电流, Ni-Al

Abstract: Ni-Al films with different thicknesses used as the bottom electrode layers are prepared on Si(100) at room temperature by magnetron sputtering method, and P(VDF-TrFE) copolymer film is prepared by direct dripping method, which is followed by an annealing process to further obtain Al/ P(VDF-TrFE)/Ni-Al/Si ferroelectric capacitor heterostructures through a shadow mask. Various techniques, such as X-ray diffraction (XRD), ferroelectric tester (Precision LC unit) have been employed to characterize the microstructure and ferroelectric properties of the ferroelectric capacitors. It is found that thickness of Ni-Al film have a large effect on leakage current of P(VDF-TrFE) copolymer film. When the thickness of Ni-Al film is 36 nm, leakage current density of P(VDF-TrFE) copolymer film is 2.09×10~(-5) A/cm~2. Leakage current mechanism of the Al/ P(VDF-TrFE)/Ni-Al/Si ferroelectric capacitor is further investigated, it is found that Al/ P(VDF-TrFE)/Ni-Al/Si corresponds to Ohmic conduction behavior at low electric field and Schottky emission at higher electric field.

Key words: P(VDF-TrFE), leakage current, Ni-Al

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