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中文
Relationship Between ESD Injected Times and Latent Damage in Semi-conductor Transistors
YANG Jie,LIU Shang-he,LIU Hong-bing,QI Shu-feng
Journal of Hebei University (Natural Science Edition) . 2007, (
6
): 620 -624 . DOI: 10.3969/j.issn.1000-1565.2007.06.014