Journal of Hebei University (Natural Science Edition) ›› 2007, Vol. 27 ›› Issue (6): 620-624.DOI: 10.3969/j.issn.1000-1565.2007.06.014

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Relationship Between ESD Injected Times and Latent Damage in Semi-conductor Transistors

YANG Jie1,LIU Shang-he1,LIU Hong-bing2,QI Shu-feng1   

  • Online:2007-11-25 Published:2007-11-25

CLC Number: