Temperature stress accelerated life test of LED bulbs and verification of test results

doi:10.3969/j.issn.1000-1565.2026.03.006

Abstract

Abstract: In order to accelerate the assessment of the expected lifespan of LED bulbs, the temperature stress accelerated life test process of LED light sources, which based on the Arrhenius e index model and the Weibull lifespan calculation model, was elaborately presented in tabular form in this paper, and the rationality and reliability of the test results were verified by using the method of linear fitting. The experimental results are in good agreement with the expected effects. Therefore, the accelerated life calculation method and verification means introduced in this paper have significant guiding significance for the assessment of the accelerated life of LED light sources.

Key words: accelerated life testing, thermal stress, Arrhenius e index model, Weibull life distribution model, straight-line fit

CLC Number:

TN312

WU Deqi, MA Li, CHU Xiaoxing, ZHAO Nannan, ZHAO Pengxi. Temperature stress accelerated life test of LED bulbs and verification of test results[J]. Journal of Hebei University(Natural Science Edition), 2026, 46(3): 278-287.

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